• DocumentCode
    3161502
  • Title

    Accelerated Moisture Sensitivity Test Methodology for Stacked-Die Molded Matrix Array Package

  • Author

    Xie, Bin ; Shi, Xunqing ; Fan, Xuejun

  • Author_Institution
    Shanghai Jiao Tong Univ., Shanghai
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    100
  • Lastpage
    104
  • Abstract
    The existing IPC/JEDEC of moisture/reflow sensitivity classification determines the time of accelerated equivalent soak by the equivalency of moisture concentration at the critical interface with the standard sensitivity test. This paper proposes a new methodology of accelerated moisture sensitivity test based on the equivalency of both local moisture concentration and overall moisture distribution for stacked-die molded matrix array package (MMAP). The new methodology can ensure the same failure rate of cracking/delamination by the equivalency of local vapor pressure, interfacial adhesion as well as the thermo- and hygro-stresses. Finite element analysis (FEA) is applied for moisture diffusion and vapor pressure analysis under the conditions of 30degC/60%RH and 60degC/60%RH, respectively. At 70 hours at 60degC/60%RH, both the local moisture concentration at critical interface and overall moisture distribution of package become identical with that at 216 at 30degC/60%RH, indicating that 70 hours is the equivalent soak time compared to the standard MSL-3 for this type of MMAP packages. Such an equivalency of the new accelerated test conditions is proven by moisture/reflow experiments under various soak times at 30degC/60%RH and 60degC/60%RH. Damage response assessed from inspection for internal cracking/delamination indicates that the accelerated test procedures are well correlated and considered indistinguishable in terms of failure rate.
  • Keywords
    cracks; delamination; finite element analysis; integrated circuit packaging; microassembling; moisture measurement; FEA; IPC-JEDEC; accelerated moisture sensitivity test methodology; cracking; delamination; finite element analysis; hygro-stresses; interfacial adhesion; microelectronic packaging; moisture diffusion; moisture-reflow sensitivity classification; stacked-die molded matrix array package; temperature 30 degC; temperature 60 degC; thermo-stresses; time 70 hour; vapor pressure analysis; Adhesives; Delamination; Electronic equipment testing; Electronic packaging thermal management; Humidity; Life estimation; Moisture; Plastics; Temperature sensors; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1323-2
  • Electronic_ISBN
    978-1-4244-1323-2
  • Type

    conf

  • DOI
    10.1109/EPTC.2007.4469765
  • Filename
    4469765