Title :
Effect of underfill on BGA reliability
Author :
Pyland, James ; Pucha, Raghuram ; Sitaraman, Suresh
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
The effect of underfill on various thermo-mechanical reliability issues in SBGA (super ball grid array) packages is studied in this paper. Non-linear finite element models with underfill and no underfill have been developed taking into consideration the process-induced residual stresses. In this study, the solder is modeled as time and temperature-dependent, while other materials are modeled temperature and direction-dependent, as appropriate. The stress/strain variations in solder joints due to thermal cycling are analyzed. The effect of underfill is studied with respect to magnitude and location of time-independent plastic strain, time-dependent creep strain and total inelastic strain in solder balls. The possibility of delamination at the interposer-underfill interface as well as board-underfill interface is studied with the help of qualitative interfacial stress analysis. Results on SBGA packages indicate chat the underfill does not always enhance BGA reliability, and that the properties of the underfill have a significant role in the overall reliability of the BGA solder balls
Keywords :
ball grid arrays; creep; delamination; encapsulation; finite element analysis; internal stresses; plastic deformation; reliability; soldering; stress analysis; BGA package; board-underfill interface; delamination; interfacial stress analysis; interposer-underfill interface; nonlinear finite element model; residual stress; solder joint; stress/strain relation; super ball grid array; thermal cycling; thermomechanical reliability; time-dependent creep strain; time-independent plastic strain; total inelastic strain; underfill material; Capacitive sensors; Creep; Electronics packaging; Finite element methods; Plastics; Residual stresses; Soldering; Temperature; Thermal stresses; Thermomechanical processes;
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-7038-4
DOI :
10.1109/ECTC.2001.927694