• DocumentCode
    3161677
  • Title

    Effect of PCB Pad Structure and PWB Build-up Layer on Solder Joint Life under Thermal Cycling and Drop Condition

  • Author

    Lee, Jong Gi ; Woo, Hyun Jong ; Hong, Ji Seok ; Kim, Pyoung Wan ; Song, Young Hee

  • Author_Institution
    Samsung Electron. Co., Ltd., Hwasung
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    471
  • Lastpage
    475
  • Abstract
    Rapid development of hand-held products has created new reliability concern, such as ability to withstand drop or shock condition. Different selections or combinations of solder alloy, surface pad finish, pad design have been studied to improve such reliability. However, the combination of enhancing drop reliability leads deterioration of thermal fatigue reliability. In order to find a best combination to satisfy both drop and thermal fatigue reliability, FBGA package with various new ball pad structures was evaluated under drop or thermal cycling. The most influence factor for thermal cycling reliability was PWB build-up layer configuration. NSMD pad definition type with VOP pad structure showed the significant improvement of drop reliability.
  • Keywords
    ball grid arrays; printed circuit testing; reliability; soldering; surface finishing; thermal stress cracking; PCB pad structure; PWB build-up layer; drop reliability; hand-held products; pad design; solder alloy; solder joint life; surface pad finish; thermal cycling; thermal fatigue reliability; Conducting materials; Copper; Dielectric materials; Electric shock; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Fatigue; Lead; Soldering; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1323-2
  • Electronic_ISBN
    978-1-4244-1323-2
  • Type

    conf

  • DOI
    10.1109/EPTC.2007.4469774
  • Filename
    4469774