DocumentCode :
3161835
Title :
Influence of a trace impurity on tin fixed point plateaus
Author :
Petchpong, Patchariya ; Head, David I. ; Au, Joe Y H
Author_Institution :
Adv. Manuf. & Enterprise Eng. Group, Brunel Univ., Uxbridge
fYear :
2008
fDate :
20-22 Aug. 2008
Firstpage :
3155
Lastpage :
3158
Abstract :
The effect of trace cobalt impurity on the realisation of a high purity (99.9999%) tin fixed-point is presented. The aim is to improve the measurement of the temperature shift caused by low level impurity dopants, to test the interpolation of previous binary alloy systems obtained using relatively high levels of impurities. The experiments and results, described below, revealed the shift of the melting and freezing curves of an initially ldquopurerdquo tin cell by -0.71 mK/ppmw of cobalt, and confirmed the reproducibility of the temperature measurements in this fixed-point cell.
Keywords :
cobalt; impurities; temperature measurement; tin alloys; binary alloy systems; dopants; temperature shift; thermometry; tin; trace cobalt impurity; Cobalt; Electrical resistance measurement; Impurities; Interpolation; Laboratories; Measurement standards; Platinum; Temperature measurement; Thermal resistance; Tin; International Temperature Scale of 1990 (ITS-90); Thermometry; Tin fixed-point temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SICE Annual Conference, 2008
Conference_Location :
Tokyo
Print_ISBN :
978-4-907764-30-2
Electronic_ISBN :
978-4-907764-29-6
Type :
conf
DOI :
10.1109/SICE.2008.4655208
Filename :
4655208
Link To Document :
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