DocumentCode :
3161858
Title :
Viscosity of a no-flow underfill during reflow and its relationship to solder wetting
Author :
Morganelli, Paul ; Wheelock, Brian
Author_Institution :
Emerson & Cuming, Billerica, MA, USA
fYear :
2001
fDate :
2001
Firstpage :
163
Lastpage :
166
Abstract :
There is much interest in understanding viscosity changes of a no-flow underfill during reflow. Viscosity changes that result from the onset of cure provide resistance to the formation of solder interconnections, and can result in a decrease in yield. The difficulty has been tracking viscosity changes during temperature profiles that vary as much as 4 degrees/second. We used microdielectrometry to make real-time ion viscosity measurements of various no-flow underfill formulations during a standard reflow temperature profile. The results clearly show the initial viscosity drop as temperature ramps up, and the point at which the effect of cure dominates and causes viscosity to rise. The data are related to DSC analysis and to solder joint yield. Overall, the results show how viscosity changes during the reflow process can potentially have a dramatic effect on assembly yield rates. The information gained is useful for developing a reflow process to form reliable solder joints
Keywords :
differential scanning calorimetry; encapsulation; reflow soldering; viscosity; DSC analysis; assembly yield rates; microdielectrometry; no-flow underfill; real-time ion viscosity measurements; reflow; solder joint yield; solder wetting; temperature profiles; viscosity changes; Assembly; Chemical processes; Curing; Dielectric loss measurement; Electrodes; Monitoring; Resins; Soldering; Temperature dependence; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-7038-4
Type :
conf
DOI :
10.1109/ECTC.2001.927712
Filename :
927712
Link To Document :
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