Title :
Optimization of integrated circuit design with respect to yield
Author :
Athay, Robert N.
Author_Institution :
Dept. of Syst. Eng., Virginia Univ., Charlottesville, VA, USA
Abstract :
In general, product design can be viewed as an optimization problem, where the objective is some measure of performance or life cycle cost. An important feature of integrated circuit fabrication that has no apparent analog in other industries is the need to consider the net yield of the fabrication process during the design phase of product development. This paper discusses the problem of optimal circuit design with respect to yield, which has become an important application for nonlinear optimization techniques
Keywords :
circuit optimisation; integrated circuit design; integrated circuit manufacture; integrated circuit yield; optimisation; product development; production control; IC manufacture; fabrication proces; integrated circuit design; life cycle cost; nonlinear optimization; optimization; product design; product development; production control; Analog integrated circuits; Cost function; Design optimization; Fabrication; Integrated circuit measurements; Integrated circuit synthesis; Integrated circuit yield; Process design; Product design; Textile industry;
Conference_Titel :
Systems, Man, and Cybernetics, 1997. Computational Cybernetics and Simulation., 1997 IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-4053-1
DOI :
10.1109/ICSMC.1997.625788
