• DocumentCode
    3162116
  • Title

    A new mathematical model for flashover voltages of polluted porcelain insulators

  • Author

    Dixit, Pradipkumar ; Krishnan, Venkat ; Nagabhushana, G.R.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Sri Bhagawan Mahaveer Jain Coll. of Eng., Bangalore, India
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    493
  • Lastpage
    496
  • Abstract
    In the present work, flashover behaviour of polluted ceramic insulators is investigated by means of experimental tests and a mathematical model. As a first step, experiments were conducted in two phases. In the first phase arc voltage-arc current behaviour were studied for scintillations on the underside of polluted insulator for different Equivalent Salt Deposit Densities and arc currents. These experimental results were then used to determine the arc constants A and n of Ayrton´s arc voltage gradient equation. In the second phase, critical current (current just before flashover) and flashover voltages were obtained experimentally for three different types of disc insulators. Based on the experimental results, a new generalized mathematical model was developed for the flashover voltage of polluted insulators. The mathematical model includes geometrical parameters of the insulator, pollution severity, critical arc length, pressure, humidity and arc constants. The model was also verified with the experimental and theoretical results of other researchers and the agreement is good.
  • Keywords
    arcs (electric); flashover; insulator contamination; porcelain insulators; arc constants; critical arc length; flashover behaviour; flashover voltage; humidity; phase arc voltage arc current; polluted porcelain insulator; pressure; Critical current; Current measurement; Flashover; Insulators; Mathematical model; Pollution; Pollution measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application (ICHVE), 2010 International Conference on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    978-1-4244-8283-2
  • Type

    conf

  • DOI
    10.1109/ICHVE.2010.5640718
  • Filename
    5640718