• DocumentCode
    3162147
  • Title

    Influence of baking conditions of doped spin-on glass sources on the formation of laser assisted selective emitters

  • Author

    Ventura, L. ; Schunck, J.P. ; Muller, J.C. ; Barthe, S. ; Vetrella, U. Besi ; Pirozzi, L. ; Salza, E.

  • Author_Institution
    Lab. PHASE, CNRS, Strasbourg, France
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    577
  • Lastpage
    580
  • Abstract
    Our purpose here is to combine the rapid thermal annealing (RTA) of doped spin-on glass films SOG layers and pulsed laser assisted treatments (Nd:YAG) in order to form selective emitters. The phosphorus doped SOG films were first rapid thermal annealed at different temperatures before laser irradiation in defined areas. For a given fluence and repetition rate, the sheet resistance values are seen to strongly depend on the baking temperature. An optimal processing temperature of 850°C has been found allowing laser treated area with low sheet resistance values as low has 20 Ω/□ and low doped area (100 Ω/□) on the untreated region. Solar cells with selective emitters made by this technique have shown higher open circuit voltage than for reference cells
  • Keywords
    electric resistance; elemental semiconductors; laser beam applications; neodymium; phosphorus; rapid thermal annealing; semiconductor materials; silicon; solar cells; solid lasers; 850 C; Nd:YAG treatment; Si:P; baking conditions; doped spin-on glass sources; higher open circuit voltage; laser assisted selective emitters; laser irradiation; optimal processing temperature; phosphorus doped SOG films; pulsed laser assisted treatments; rapid thermal annealing; sheet resistance; spin-on glass films; Crystallization; Doping; Glass; Performance evaluation; Photovoltaic cells; Rapid thermal annealing; Silicon; Surface emitting lasers; Surface resistance; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564072
  • Filename
    564072