DocumentCode
3162247
Title
On the effect of system constraints on mechanical integrity of high density packages used in telecommunication applications
Author
Langari, A.R. ; Morris, W.L. ; Kuhlman, M. ; Hashemi, H.S. ; Dadkhah, M.S.
Author_Institution
Dept. of Adv. Packagin, Mindspeed Technol. Inc., Newport Beach, CA, USA
fYear
2001
fDate
2001
Firstpage
264
Lastpage
269
Abstract
A system level mechanical analysis was performed to optimize the mechanical integrity of a high-density MCM package, employing ball grid array technology, and being used in a telecommunications application. Post manufacturing processes in addition to the system constraints can affect the mechanical integrity of packages already qualified at the component level. The prediction of these large-scale effects and integrating the new insights into the package design guidelines is very important in achieving applications reliability. We have fully analyzed the system behavior of a test structure intended for a high-density telecommunication application. The analysis activities were accelerated using highly integrated internally developed codes, compatible with commercial finite-element-analysis tools. The study included a set of experimental test structures, and a full set of system validation experiments. In this paper, we present the results of this study which proposes a system analysis methodology along with describing the related analysis results, covering the effect of a large set of design parameters effecting the mechanical integrity of the package. These results and methods are being used for design optimization analysis at Mindspeed Technologies Inc
Keywords
ball grid arrays; finite element analysis; multichip modules; telecommunication equipment; ball grid array; design optimization; finite element analysis; high-density MCM package; manufacturing process; mechanical integrity; system constraints; system-level mechanical analysis; telecommunication equipment; Acceleration; Components, packaging, and manufacturing technology; Design optimization; Electronics packaging; Finite element methods; Guidelines; Large scale integration; Manufacturing processes; Performance analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location
Orlando, FL
ISSN
0569-5503
Print_ISBN
0-7803-7038-4
Type
conf
DOI
10.1109/ECTC.2001.927733
Filename
927733
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