Title :
On a new approach for enhancing the fault coverage of conformance testing of protocols
Author :
Lombardi, F. ; Shen, Y.-N. ; Kari, H.
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
Abstract :
Proposes a new approach for enhancing the fault coverage of protocol testing using unique input/output (UIO) sequences. UIO sequences can be efficiently employed in checking the conformance specifications of protocols by transition testing and an optimization process based on the rural Chinese postman tour algorithm. The proposed approach is based on a new set of conditions for UIO sequence generation, namely singularity, i.e. uniqueness between UIO sequences in the traversal of the FSM and their ability to avoid masking and undetection of faults
Keywords :
conformance testing; fault tolerant computing; finite state machines; formal verification; protocols; conformance specifications; conformance testing; fault coverage; optimization process; protocol testing; rural Chinese postman tour algorithm; singularity; transition testing; unique input/output sequences; Computer science; Fault detection; Protocols; Testing;
Conference_Titel :
Parallel and Distributed Processing, 1991. Proceedings of the Third IEEE Symposium on
Conference_Location :
Dallas, TX
Print_ISBN :
0-8186-2310-1
DOI :
10.1109/SPDP.1991.218209