• DocumentCode
    3162374
  • Title

    Partial Scan with Pre-selected Scan Signals

  • Author

    Peichen Pan, C.L. Liu

  • Author_Institution
    Department of Computer Science, University of Illinois at Urbana-Champaign, Urbana, IL
  • fYear
    1995
  • fDate
    1995
  • Firstpage
    189
  • Lastpage
    194
  • Abstract
    A partial scan approach proposed recently selects scan signals without considering the availability of the ip-ops (FFs). Such an approach can greatly reduce the number of scan signals since maximum freedom is allowed in scan signal selection. To actually scan the selected signals, we, however, must make them FF-driving signals. In this paper, we study the problem of modifying and retiming a circuit to make a pre-selected set of scan signals FF-driving signals while preserving the set of cycles being broken. We present a new approach for solving this problem. Based on the new approach we design an efficient algorithm. Unlike a previous algorithm which inherently has no control over the area overhead incurred during the modification, our algorithm explicitly minimizes the area overhead. The algorithm has been implemented and encouraging results were obtained.
  • Keywords
    Algorithm design and analysis; Circuit faults; Circuit testing; Computer science; Feedback loop; Iterative algorithms; Logic; Sequential analysis; Sequential circuits; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1995. DAC '95. 32nd Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    0-89791-725-1
  • Type

    conf

  • DOI
    10.1109/DAC.1995.250088
  • Filename
    1586700