DocumentCode :
3162374
Title :
Partial Scan with Pre-selected Scan Signals
Author :
Peichen Pan, C.L. Liu
Author_Institution :
Department of Computer Science, University of Illinois at Urbana-Champaign, Urbana, IL
fYear :
1995
fDate :
1995
Firstpage :
189
Lastpage :
194
Abstract :
A partial scan approach proposed recently selects scan signals without considering the availability of the ip-ops (FFs). Such an approach can greatly reduce the number of scan signals since maximum freedom is allowed in scan signal selection. To actually scan the selected signals, we, however, must make them FF-driving signals. In this paper, we study the problem of modifying and retiming a circuit to make a pre-selected set of scan signals FF-driving signals while preserving the set of cycles being broken. We present a new approach for solving this problem. Based on the new approach we design an efficient algorithm. Unlike a previous algorithm which inherently has no control over the area overhead incurred during the modification, our algorithm explicitly minimizes the area overhead. The algorithm has been implemented and encouraging results were obtained.
Keywords :
Algorithm design and analysis; Circuit faults; Circuit testing; Computer science; Feedback loop; Iterative algorithms; Logic; Sequential analysis; Sequential circuits; Signal design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1995. DAC '95. 32nd Conference on
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
0-89791-725-1
Type :
conf
DOI :
10.1109/DAC.1995.250088
Filename :
1586700
Link To Document :
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