DocumentCode :
3162384
Title :
Radiated electromagnetic field signature of faulty and polluted porcelain insulators
Author :
Azordegan, Ehsan ; Kordi, Behzad ; Swatek, David R.
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Manitoba, Winnipeg, MB, Canada
fYear :
2010
fDate :
11-14 Oct. 2010
Firstpage :
449
Lastpage :
452
Abstract :
Porcelain cap and pin insulators are by far the most popular suspension insulators in high-voltage distribution networks all around the world. Inspection and condition monitoring of HV insulators is also a very hot research topic because of the critical and vital role that they play in distribution systems. A new condition assessment method based on electromagnetic radiations from porcelain insulators is presented. In a lab environment, a 45 KV transformer is connected to a string of two porcelain insulators. Electromagnetic radiations from the insulators are captured by different receivers. A polluted insulator and a cracked insulator were studied as a faulty insulator on the string. Pollution is artificially added to the surface of the insulator and another insulator was intentionally cracked for the tests. The electromagnetic radiated signature of a polluted insulator and a cracked insulator was captured and analyzed and a comparison between them is also presented.
Keywords :
electromagnetic waves; insulator contamination; porcelain insulators; power transformers; HV insulators; condition assessment method; condition monitoring; cracked insulator; faulty porcelain insulators; high-voltage distribution networks; inspection; lab environment; pin insulators; polluted porcelain insulators; porcelain cap; radiated electromagnetic field signature; suspension insulators; transformer; voltage 45 kV; Electric fields; Electromagnetic radiation; Insulators; Oscilloscopes; Partial discharges; Porcelain; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Voltage Engineering and Application (ICHVE), 2010 International Conference on
Conference_Location :
New Orleans, LA
Print_ISBN :
978-1-4244-8283-2
Type :
conf
DOI :
10.1109/ICHVE.2010.5640731
Filename :
5640731
Link To Document :
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