DocumentCode :
3162388
Title :
New developments in single pass reflow encapsulant for flip chip application
Author :
Liu, Jean ; Kraszewski, Rich ; Lin, Xin ; Wong, Linda ; Goh, SH ; Allen, Jennifer
Author_Institution :
Kester Solder-Litton Syst. Inc., Des Plaines, IL, USA
fYear :
2001
fDate :
2001
Firstpage :
317
Lastpage :
322
Abstract :
This paper introduces a series of single pass reflow encapsulants that requires no post curing after solder bump reflow. Acting as a flux and an encapsulant, this product performs two functions. First, the material activates the solder bump and metallic bond pad during solder reflow to establish the interconnection between the die and substrate. Second, while this material is being cured, it forms a mechanical bond between the surface of the die and substrate. This product allows processing normal surface mount component packages concurrently with flip chip, CSPs or BGAs under the standard surface mount reflow-profile. Such a process eliminates capillary underfilling and curing time. The product´s solderability is robust and high yield; the parts are reliable after thermal shock testing. We have employed DSC, TMA, DMA and shear test techniques to investigate the properties of the material. These properties include influence of filler loading level, curing reflow profile, percentage cure, glass transition temperature (Tg), coefficient of thermal expansion (CTE), modulus and die shear adhesion
Keywords :
adhesion; ball grid arrays; chip scale packaging; encapsulation; flip-chip devices; reflow soldering; surface mount technology; BGA; CSP; DMA; DSC; TMA; curing reflow profile; die shear adhesion; die-substrate interconnection; elastic modulus; filler loading level; flip-chip package; glass transition temperature; mechanical bond; metallic bond pad; shear testing; single pass reflow encapsulant; solder bump; surface mount component; thermal expansion coefficient; thermal shock testing; Bonding; Curing; Electric shock; Flip chip; Glass; Inorganic materials; Materials testing; Packaging; Robustness; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
ISSN :
0569-5503
Print_ISBN :
0-7803-7038-4
Type :
conf
DOI :
10.1109/ECTC.2001.927742
Filename :
927742
Link To Document :
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