Title :
Preparation of Cu(In1−xAlx)Se2 thin films by sol-gel method
Author :
Lingjun Kong ; Guilin Chen ; Chenchen Yuan ; Guoshun Jiang ; Changfei Zhu ; Weifeng Liu
Author_Institution :
Dept. of Mater. Sci. & Eng., Univ. of Sci. & Technol. of China Hefei, Hefei, China
Abstract :
Polycrystalline Cu(In1-xAlx)Se2 (CIAS) thin films with chalcopyrite structure were synthesized by sol-gel spin-coating method using nitrates as precursor for low-cost photovoltaic applications. Sequential reduction and selenization treatments were performed with hydrogen and Se vapor, respectively. X-ray diffraction (XRD), SEM, EDS and UV-visible spectrophotometer analysis have been employed to examine the structural properties, surface morphology, atomic concentrations and band gaps of polycrystalline CIAS thin films. The experimental results demonstrated that the Cu(In1-xAlx)Se2 had good crystallinity, uniformity and stoichiometric composition. Simultaneously, we discussed the phenomenon and mechanism of the two-layered structure formation of the synthesized Cu(In1-xAlx)Se2 thin film.
Keywords :
X-ray chemical analysis; X-ray diffraction; absorption coefficients; aluminium compounds; copper compounds; energy gap; indium compounds; scanning electron microscopy; semiconductor growth; semiconductor thin films; sol-gel processing; spin coating; stoichiometry; surface morphology; ternary semiconductors; ultraviolet spectra; visible spectra; Cu(In1-xAlx)Se2; EDS; SEM; UV-visible spectrophotometer; X-ray diffraction; XRD; atomic concentrations; band gaps; chalcopyrite structure; crystallinity; nitrates; photovoltaic applications; polycrystalline thin films; selenization treatments; sequential reduction; sol-gel spin-coating method; stoichiometric composition; structural properties; surface morphology; two-layered structure formation; Carbon; Films; Metals; Photonic band gap; Photovoltaic cells; X-ray scattering; CIAS; Chalcopyrite; Cu(In1−xAlx)Se2; sol-gel; spin-coating;
Conference_Titel :
Materials for Renewable Energy and Environment (ICMREE), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-3335-8
DOI :
10.1109/ICMREE.2013.6893612