Title :
Dielectric breakdown in PLZT 9.5/65/35 ceramics
Author :
Furman, E. ; Cross, L.E.
Author_Institution :
Dept. of Ceramic Eng., Clemson Univ., SC, USA
Abstract :
There is currently a trend to reduce the thickness of the dielectrics and to operate them at higher field levels. Understanding and controlling the breakdown strength will permit higher operating fields. The main goal of this work was to establish the breakdown mechanism in PLZT ceramics. The breakdown experiments were conducted with both hot-pressed and conventional ceramics. The breakdown strength was studied as a function of electrode material, voltage polarity, ramp rate, and temperature. All of the results were consistent with electromechanical breakdown being the dominant mechanism
Keywords :
ceramics; electric breakdown; electromechanical effects; ferroelectric materials; lanthanum compounds; lead compounds; piezoceramics; PLZT; PLZT 9.5/65/35 ceramics; PbLaZrO3TiO3; breakdown mechanism; conventional ceramics; dielectric breakdown; electrode material; electromechanical breakdown; high field levels; hot-pressed ceramics; ramp rate; temperature dependence; thickness; voltage polarity; Breakdown voltage; Ceramics; Dielectric breakdown; Dielectric materials; Electric breakdown; Electrodes; Ferroelectric materials; Gold; Powders; Thermal conductivity;
Conference_Titel :
Applications of Ferroelectrics, 1994.ISAF '94., Proceedings of the Ninth IEEE International Symposium on
Conference_Location :
University Park, PA
Print_ISBN :
0-7803-1847-1
DOI :
10.1109/ISAF.1994.522434
