• DocumentCode
    3162538
  • Title

    A Wide Area Vertical Expansion (WAVETM) packaging process development

  • Author

    Li, Delin ; Light, David ; Castillo, Dennis ; Beroz, Masud ; Nguyen, Max ; Wang, Tony

  • Author_Institution
    Tessera Inc., San Jose, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    367
  • Lastpage
    371
  • Abstract
    During the later 1990´s, Tessera introduced a semiconductor packaging technology called WAVE (Wide Area Vertical Expansion) package to address the growing need for high pin count, high speed, high thermal dissipation, and high environmental reliability in advanced electronic packaging. The WAVE technology is an extension of Tessera´s compliant packaging technologies that places a low modulus encapsulant between the silicon die and the package substrate to solve their CTE mismatch problem. The WAVE technology allows for compliant vertical interconnection links to be formed between the ICs and the substrate, with no need for a bond window. These interconnections are made simultaneously, in contrast to single point wire or lead bonding. The compliant interconnections and low modulus encapsulant enable the stress on BGA solder balls to be minimized. The WAVE package utilizes advanced materials and design to provide a unique combination of high electrical and thermal performance, high environmental reliability, and cost effective IC interconnection methodology. This paper presents one of the latest WAVE technology developments at Tessera
  • Keywords
    ball grid arrays; cooling; encapsulation; integrated circuit packaging; integrated circuit reliability; thermal expansion; BGA solder balls; CTE mismatch; Tessera; WAVE; compliant vertical interconnection links; environmental reliability; low modulus encapsulant; packaging process development; pin count; semiconductor packaging technology; thermal dissipation; wide area vertical expansion; Bonding; Electronic packaging thermal management; Electronics packaging; Lead; Semiconductor device packaging; Semiconductor device reliability; Silicon; Substrates; Thermal expansion; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2001. Proceedings., 51st
  • Conference_Location
    Orlando, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7038-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2001.927750
  • Filename
    927750