DocumentCode
3162569
Title
Second-order statistics of 2D non isotropic mobile-to-mobile wireless channels
Author
Samarasinghe, Prasad T. ; Abhayapala, Thushara D. ; Lamahewa, Tharaka A. ; Kennedy, Rodney A.
Author_Institution
Appl. Signal Process. Group, Australian Nat. Univ., Canberra, ACT, Australia
fYear
2011
fDate
11-14 Sept. 2011
Firstpage
1667
Lastpage
1671
Abstract
This paper derives closed form expressions for second order statistics of mobile-to-mobile wireless channels in non isotropic environments. Specifically, we consider Rice, Rayleigh and Nakagami fading channels in four different non isotropic scattering environments with Angle of Departure (AoD) and Angle of Arrival (AoA) distributions given by (i) separable Truncated Gaussian, (ii) separable von-Mises, (iii) Truncated Gaussian bivariate and (iv) Truncated Laplacian bivariate distributions. We have shown that the second order statistics, namely, the Level Crossing Rate (LCR) and the Average Fade Duration (AFD) in different fading channels can be expressed in terms of known scattering coefficients of the above angle of departure and arrival distributions. We have illustrated the usefulness of the results by plotting LCR and AFD against the channel correlation for various scattering scenarios.
Keywords
Gaussian distribution; Nakagami channels; Rayleigh channels; direction-of-arrival estimation; mobile radio; scattering; statistical analysis; 2D nonisotropic mobile-to-mobile wireless channel; Nakagami fading channel; Rayleigh fading channel; Rice fading channel; angle of arrival distribution; angle of departure distribution; average fade duration; channel correlation; isotropic scattering environment; level crossing rate; scattering coefficient; second-order statistics; truncated Gaussian bivariate distribution; truncated Laplacian bivariate distribution; Correlation; Fading; Nakagami distribution; Power distribution; Receivers; Scattering; Transmitters;
fLanguage
English
Publisher
ieee
Conference_Titel
Personal Indoor and Mobile Radio Communications (PIMRC), 2011 IEEE 22nd International Symposium on
Conference_Location
Toronto, ON
ISSN
pending
Print_ISBN
978-1-4577-1346-0
Electronic_ISBN
pending
Type
conf
DOI
10.1109/PIMRC.2011.6139788
Filename
6139788
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