DocumentCode :
316257
Title :
Artificial immunity based management system for a semiconductor production line
Author :
Mori, Kazuyuki ; Tsukiyama, Makoto ; Fukuda, Toyoo
Author_Institution :
Ind. Electron. & Syst. Labs., Mitsubishi Electr. Corp., Hyogo, Japan
Volume :
1
fYear :
1997
fDate :
12-15 Oct 1997
Firstpage :
851
Abstract :
A semiconductor production line is a large scale and complex system. It is considered to be difficult to control because there exist lots of malfunctions such as maintenance of equipment, equipment break-down and imbalance of WIP to disturb production of wafers in the semiconductor production system. Methods and systems using simulations or expert systems have been used to solve these disturbances, the but semiconductor production environments change dynamically and therefore these methods alone do not yield a perfect control system. This paper presents a method applying an artificial immunity based system described by multi-agent nets, that adapts itself to a dynamical environment
Keywords :
Petri nets; integrated circuit manufacture; large-scale systems; production control; WIP imbalance; artificial immunity based management system; colored Petri nets; dynamical environment; equipment break-down; expert systems; large-scale complex system; maintenance; malfunctions; multi-agent nets; semiconductor production line; wafer production; Control systems; Dispatching; Expert systems; Immune system; Industrial electronics; Information processing; Laboratories; Large scale integration; Large-scale systems; Production systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man, and Cybernetics, 1997. Computational Cybernetics and Simulation., 1997 IEEE International Conference on
Conference_Location :
Orlando, FL
ISSN :
1062-922X
Print_ISBN :
0-7803-4053-1
Type :
conf
DOI :
10.1109/ICSMC.1997.626207
Filename :
626207
Link To Document :
بازگشت