• DocumentCode
    316257
  • Title

    Artificial immunity based management system for a semiconductor production line

  • Author

    Mori, Kazuyuki ; Tsukiyama, Makoto ; Fukuda, Toyoo

  • Author_Institution
    Ind. Electron. & Syst. Labs., Mitsubishi Electr. Corp., Hyogo, Japan
  • Volume
    1
  • fYear
    1997
  • fDate
    12-15 Oct 1997
  • Firstpage
    851
  • Abstract
    A semiconductor production line is a large scale and complex system. It is considered to be difficult to control because there exist lots of malfunctions such as maintenance of equipment, equipment break-down and imbalance of WIP to disturb production of wafers in the semiconductor production system. Methods and systems using simulations or expert systems have been used to solve these disturbances, the but semiconductor production environments change dynamically and therefore these methods alone do not yield a perfect control system. This paper presents a method applying an artificial immunity based system described by multi-agent nets, that adapts itself to a dynamical environment
  • Keywords
    Petri nets; integrated circuit manufacture; large-scale systems; production control; WIP imbalance; artificial immunity based management system; colored Petri nets; dynamical environment; equipment break-down; expert systems; large-scale complex system; maintenance; malfunctions; multi-agent nets; semiconductor production line; wafer production; Control systems; Dispatching; Expert systems; Immune system; Industrial electronics; Information processing; Laboratories; Large scale integration; Large-scale systems; Production systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man, and Cybernetics, 1997. Computational Cybernetics and Simulation., 1997 IEEE International Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1062-922X
  • Print_ISBN
    0-7803-4053-1
  • Type

    conf

  • DOI
    10.1109/ICSMC.1997.626207
  • Filename
    626207