Title :
Widely linear vs. conventional subspace-based estimation of SIMO flat-fading channels
Author :
Abdallah, Saeed ; Psaromiligkos, Ioannis N.
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montréal, QC, Canada
Abstract :
We analyze the mean-squared error (MSE) performance of widely linear (WL) and conventional subspace-based channel estimation for single-input multiple-output (SIMO) flat-fading channels employing binary phase-shift-keying (BPSK) modulation when the covariance matrix is estimated using a finite number of samples. The conventional estimator suffers from a phase ambiguity that reduces to a sign ambiguity for the WL estimator. We derive closed-form expressions for the MSE of the two estimators under four different scenarios which vary in the amount and accuracy of the information available for ambiguity resolution. Our work demonstrates that the relative performance of WL and conventional subspace-based estimators is strongly related to the accuracy of ambiguity resolution and shows that the less information available about the actual channel for ambiguity resolution, or the lower the accuracy of this information, the more favorable the WL estimator becomes.
Keywords :
channel estimation; covariance matrices; fading channels; mean square error methods; phase shift keying; signal resolution; SIMO flat-fading channel; WL estimator; ambiguity resolution; binary phase-shift-keying modulation; closed-form expression; conventional subspace-based channel estimation; covariance matrix; mean-squared error performance; phase ambiguity; single-input multiple-output flat-fading channel; widely linear-based channel estimation; Accuracy; Channel estimation; Closed-form solutions; Eigenvalues and eigenfunctions; Estimation; Random variables; Vectors; Channel Estimation; SIMO; Subspace; Widely Linear;
Conference_Titel :
Personal Indoor and Mobile Radio Communications (PIMRC), 2011 IEEE 22nd International Symposium on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4577-1346-0
Electronic_ISBN :
pending
DOI :
10.1109/PIMRC.2011.6139789