Title :
Characterization, calibration and macromodeling of RF current probes
Author :
Iddagoda, Mavidu Nipunath ; Venkatarayalu, Neelakantam V. ; Gan, Yeow Beng
Author_Institution :
EADS Innovation Works, Singapore, Singapore
Abstract :
Characterization of a current probe by measuring three port S-parameters with the probe clamped to a calibration fixture is presented. A simple calibration fixture based on a wire over ground plane is used. From the measured 3-port S-parameters, accurate de-embedding is performed to remove the fixture and transmission line effects to obtain the S-parameters of the current probe. Equivalent circuit representation of the fixture is utilized in the de-embedding procedure. Subsequently, vector fitting based macromodeling of the de-embedded S-parameters of the probe is performed. SPICE-compatible equivalent circuits are then obtained and their use in the simulation of physical tests with circuit simulators is demonstrated. Results for both commercial and simple in-house designed current probes are presented.
Keywords :
S-parameters; SPICE; calibration; electric current measurement; probes; 3-port S-parameters; RF current probes calibration; RF current probes characterization; RF current probes macromodeling; SPICE-compatible equivalent circuits; calibration fixture; circuit simulators; deembedding procedure; macromodeling; three port S-parameters; transmission line effects; vector fitting; Calibration; Circuit simulation; Circuit testing; Current measurement; Equivalent circuits; Fixtures; Probes; Radio frequency; Scattering parameters; Transmission line measurements; Bulk Current Injection; Calibration; Current Probe; Macromodeling; SPICE modeling; Vector Fitting;
Conference_Titel :
Microwave Conference, 2009. APMC 2009. Asia Pacific
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2801-4
Electronic_ISBN :
978-1-4244-2802-1
DOI :
10.1109/APMC.2009.5384143