• DocumentCode
    3162664
  • Title

    Delayed Frontal Solution for Finite-Element based Resistance Extraction

  • Author

    N.P. van der Meijs, A.J. van Genderen

  • Author_Institution
    Delft University of Technology, Department of Electrical Engineering, Delft, The Netherlands
  • fYear
    1995
  • fDate
    1995
  • Firstpage
    273
  • Lastpage
    278
  • Abstract
    To save memory, layout-to-circuit extractors that use the Finite-Element Method for resistance extraction usually solve the corresponding set of equations with a frontal solution method. We show that this method is inefficient when used with a scanline ordering of the elements. As an improvement, we introduce the Delayed Frontal Solution algorithm, which allows us to replace the scanline ordering by the minimumdegree ordering. Thus, extraction times are reduced with more than one order of magnitude at a small cost of extra memory.
  • Keywords
    Costs; Delay effects; Electric resistance; Finite element methods; Integrated circuit interconnections; Laplace equations; Permission; Very large scale integration; Voltage; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1995. DAC '95. 32nd Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    0-89791-725-1
  • Type

    conf

  • DOI
    10.1109/DAC.1995.250103
  • Filename
    1586715