Title :
Towards noise-robust speaker recognition using probabilistic linear discriminant analysis
Author :
Lei, Yun ; Burget, Lukas ; Ferrer, Luciana ; Graciarena, Martin ; Scheffer, Nicolas
Author_Institution :
SRI Int., Menlo Park, CA, USA
Abstract :
This work addresses the problem of speaker verification where additive noise is present in the enrollment and testing utterances. We show how the current state-of-the-art framework can be effectively used to mitigate this effect. We first look at the degradation a standard speaker verification system is subjected to when presented with noisy speech waveforms. We designed and generated a corpus with noisy conditions, based on the NIST SRE 2008 and 2010 data, built using open-source tools and freely available noise samples. We then show how adding noisy training data in the current i-vector-based approach followed by probabilistic linear discriminant analysis (PLDA) can bring significant gains in accuracy at various signal-to-noise ratio (SNR) levels. We demonstrate that this improvement is not feature-specific as we present positive results for three disparate sets of features: standard mel frequency cepstral coefficients, prosodic polynomial co-efficients and maximum likelihood linear regression (MLLR) transforms.
Keywords :
maximum likelihood estimation; noise; polynomials; probability; regression analysis; speaker recognition; transforms; NIST SRE 2008 data; NIST SRE 2010 data; additive noise; enrollment utterance; i-vector-based approach; maximum likelihood linear regression transforms; noise-robust speaker recognition; noisy speech waveform; noisy training data; open-source tool; probabilistic linear discriminant analysis; prosodic polynomial co-efficients; signal-to-noise ratio level; speaker verification system; standard mel frequency cepstral coefficients; testing utterance; Degradation; NIST; Noise measurement; Signal to noise ratio; Speech; Training; PLDA; Speaker Recognition; i-vector; noise; robustness;
Conference_Titel :
Acoustics, Speech and Signal Processing (ICASSP), 2012 IEEE International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-0045-2
Electronic_ISBN :
1520-6149
DOI :
10.1109/ICASSP.2012.6288858