• DocumentCode
    3162813
  • Title

    Effect of Aging Conditions on Impact Strength of Sn-3.5 Based Solder Joint

  • Author

    Nishikawa, Hiroshi ; Miki, Kousuke ; Takemoto, Tadashi

  • Author_Institution
    Osaka Univ., Suita
  • fYear
    2007
  • fDate
    10-12 Dec. 2007
  • Firstpage
    553
  • Lastpage
    556
  • Abstract
    In general, lead-free solders possess more brittle mechanical properties compared with Sn-Pb eutectic solder, and the thick intermetallic layer at the interface between the solder and substrate is sensitive to stress and provides sites of initiation and paths of propagation for cracks. Therefore, it is important to study the relationship between the interfacial reaction and the joint strength by using a solder bump. In this study, in order to evaluate the joint reliability for Sn-3.5Ag based solder with a Ni-P plating, a new ball impact test were applied. And the effect of aging conditions on impact strength of the solder joint was investigated. As a result, it was clear that the fracture at the interface, where intermetallic compounds was formed, was occurred. In the case of Sn-3.5Ag-Co solder, the impact strength gradually decreased with the increase of the aging time. The ball impact test was suitable for the characterization of the strength of intermetallic compound at the interface and the evaluation of the reliability for drop impact.
  • Keywords
    ageing; cracks; electroplating; impact strength; impact testing; solders; stress effects; Ni-P; SnAg; SnAgCo; aging conditions; ball impact test; brittle mechanical properties; cracks; drop impact reliability; eutectic solder; impact strength; interfacial reaction; intermetallic compounds; joint reliability; joint strength; lead-free solders; plating; solder bump; solder joint; stress; substrate; thick intermetallic layer; Aging; Electronics packaging; Environmentally friendly manufacturing techniques; Intermetallic; Lead; Optical microscopy; Optical surface waves; Scanning electron microscopy; Soldering; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2007. EPTC 2007. 9th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-1323-2
  • Electronic_ISBN
    978-1-4244-1323-2
  • Type

    conf

  • DOI
    10.1109/EPTC.2007.4469834
  • Filename
    4469834