• DocumentCode
    3162823
  • Title

    Estimating the intrinsic difficulty of a recognition problem

  • Author

    Ho, Tin Kam ; Baird, Henry S.

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • Volume
    2
  • fYear
    1994
  • fDate
    9-13 Oct 1994
  • Firstpage
    178
  • Abstract
    Describes an experiment in estimating the Bayes error of an image classification problem: a difficult, practically important, two-class character recognition problem. The Bayes error gives the “intrinsic difficulty” of the problem since it is the minimum error achievable by any classification method. Since for many realistically complex problems, deriving this analytically appears to be hopeless, the authors approach the task empirically. The authors proceed first by expressing the problem precisely in terms of ideal prototype images and an image defect model, and then by carrying out the estimation on pseudorandomly simulated data. Arriving at sharp estimates seems inevitably to require both large sample sizes-in the authors´ trial, over a million images-and careful statistical extrapolation. The study of the data reveals many interesting statistics, which allow the prediction of the worst-case time/space requirements for any given classifier performance, expressed as a combination of error and reject rates
  • Keywords
    character recognition; Bayes error; classifier performance; image classification problem; image defect model; intrinsic difficulty; prototype images; recognition problem; reject rates; sharp estimates; statistical extrapolation; two-class character recognition problem; worst-case time/space requirements; Concrete; Hyperspectral imaging; Image classification; Image sampling; Indexes; Machine vision; Optical character recognition software; Space technology; Tin; Virtual prototyping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 1994. Vol. 2 - Conference B: Computer Vision & Image Processing., Proceedings of the 12th IAPR International. Conference on
  • Conference_Location
    Jerusalem
  • Print_ISBN
    0-8186-6270-0
  • Type

    conf

  • DOI
    10.1109/ICPR.1994.576899
  • Filename
    576899