Title :
Estimating the intrinsic difficulty of a recognition problem
Author :
Ho, Tin Kam ; Baird, Henry S.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Abstract :
Describes an experiment in estimating the Bayes error of an image classification problem: a difficult, practically important, two-class character recognition problem. The Bayes error gives the “intrinsic difficulty” of the problem since it is the minimum error achievable by any classification method. Since for many realistically complex problems, deriving this analytically appears to be hopeless, the authors approach the task empirically. The authors proceed first by expressing the problem precisely in terms of ideal prototype images and an image defect model, and then by carrying out the estimation on pseudorandomly simulated data. Arriving at sharp estimates seems inevitably to require both large sample sizes-in the authors´ trial, over a million images-and careful statistical extrapolation. The study of the data reveals many interesting statistics, which allow the prediction of the worst-case time/space requirements for any given classifier performance, expressed as a combination of error and reject rates
Keywords :
character recognition; Bayes error; classifier performance; image classification problem; image defect model; intrinsic difficulty; prototype images; recognition problem; reject rates; sharp estimates; statistical extrapolation; two-class character recognition problem; worst-case time/space requirements; Concrete; Hyperspectral imaging; Image classification; Image sampling; Indexes; Machine vision; Optical character recognition software; Space technology; Tin; Virtual prototyping;
Conference_Titel :
Pattern Recognition, 1994. Vol. 2 - Conference B: Computer Vision & Image Processing., Proceedings of the 12th IAPR International. Conference on
Conference_Location :
Jerusalem
Print_ISBN :
0-8186-6270-0
DOI :
10.1109/ICPR.1994.576899