Title :
Impact Of The Self-heating Effect On Circuit Performance Estimation Using DC Model Parameters
Author :
Takace, D. ; Trager, J. ; Schmitt-Landsiedel, D.
Author_Institution :
Siemens Ag
Keywords :
Circuit optimization; Coupling circuits; MOSFETs; Power measurement; Pulse measurements; Steady-state; Temperature dependence; Temperature distribution; Testing; Very large scale integration;
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/ICMTS.1988.672928
