DocumentCode :
3163173
Title :
Mixed-Signal Switching Noise Analysis Using Voronoi-Tessellated Substrate Macromodels
Author :
Ivan L. Wemple, Andrew T. Yang
Author_Institution :
Department of Electrical Engineering, University of Washington
fYear :
1995
fDate :
1995
Firstpage :
439
Lastpage :
444
Abstract :
We present a new modeling technique for analyzing the impact of substrate-coupled switching noise in CMOS mixed-signal circuits. Lumped element RC substrate macromodels are efficiently generated from layout using Voronoi tessellation. The models retain the accuracy of previously proposed models, but contain orders of magnitude fewer circuit nodes, and are suitable for analyzing large-scale circuits. The modeling strategy has been verified using detailed device simulation, and applied to some mixed-A/D circuit examples.
Keywords :
Active circuits; Circuit topology; Design automation; Distributed computing; Integrated circuit interconnections; MOSFETs; Machinery; Network topology; Permission; Semiconductor process modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1995. DAC '95. 32nd Conference on
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
0-89791-725-1
Type :
conf
DOI :
10.1109/DAC.1995.249987
Filename :
1586743
Link To Document :
بازگشت