Title :
Mixed-Signal Switching Noise Analysis Using Voronoi-Tessellated Substrate Macromodels
Author :
Ivan L. Wemple, Andrew T. Yang
Author_Institution :
Department of Electrical Engineering, University of Washington
Abstract :
We present a new modeling technique for analyzing the impact of substrate-coupled switching noise in CMOS mixed-signal circuits. Lumped element RC substrate macromodels are efficiently generated from layout using Voronoi tessellation. The models retain the accuracy of previously proposed models, but contain orders of magnitude fewer circuit nodes, and are suitable for analyzing large-scale circuits. The modeling strategy has been verified using detailed device simulation, and applied to some mixed-A/D circuit examples.
Keywords :
Active circuits; Circuit topology; Design automation; Distributed computing; Integrated circuit interconnections; MOSFETs; Machinery; Network topology; Permission; Semiconductor process modeling;
Conference_Titel :
Design Automation, 1995. DAC '95. 32nd Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-89791-725-1
DOI :
10.1109/DAC.1995.249987