Title :
Ring Oscillator Structure For realistic Dynamic Stress Of MOSFETS And Interconnects
Author :
Winnerl, J. ; Neppl, F. ; Lill, A. ; Röska, G. ; Zatisch, W.
Author_Institution :
Siemens Ag
Keywords :
Circuit testing; Degradation; Hot carriers; Life testing; MOSFETs; Pulse circuits; Pulsed power supplies; Ring oscillators; Stress; Voltage-controlled oscillators;
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/ICMTS.1988.672929
