Title :
Total Dose Radiation Respnse Of Test Structures And VLSI Lcqic Devices: An Analytical And Experimental Correlation
Author :
Newberry, D.M. ; Peters, B.E.
Author_Institution :
Control Data Corporation
Keywords :
Current measurement; Delay; Frequency measurement; Geometry; Leakage current; Medical tests; Microelectronics; Solid modeling; Testing; Very large scale integration;
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/ICMTS.1988.672930
