DocumentCode :
3163262
Title :
Determination Of Process-dependent Critical SPICE Parameters For Application-specific ICs
Author :
Sheu, Bing J. ; Wan, Chung-Ping ; Shih, Chih-Ching ; Wen-Jay Hsu ; Hsu, Ming C.
Author_Institution :
University Of Southern California
fYear :
1988
fDate :
22-23 Feb. 1988
Firstpage :
73
Lastpage :
78
Keywords :
Application specific integrated circuits; Circuit analysis; Circuit simulation; Circuit testing; Computational efficiency; Computational modeling; Fabrication; MOSFETs; SPICE; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
Type :
conf
DOI :
10.1109/ICMTS.1988.672932
Filename :
672932
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3163262
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