DocumentCode :
3163282
Title :
A Fully Analytical MOSFET Model Parameter Extraction Approach
Author :
Tuinhout, Hans P. ; Swaving, Sieger ; Joosten, Jos J M
Author_Institution :
Philips Research Laboratories
fYear :
1988
fDate :
22-23 Feb. 1988
Firstpage :
79
Lastpage :
84
Keywords :
Analytical models; Design automation; Design engineering; MOSFET circuits; Parameter extraction; Process control; Production; Research and development; Semiconductor device modeling; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
Type :
conf
DOI :
10.1109/ICMTS.1988.672933
Filename :
672933
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3163282
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