• DocumentCode
    3163311
  • Title

    Recognition on ultra-high-frequency signals of partial discharge by support vector machine

  • Author

    Jiang, Tianyan ; Li, Jian ; Chen, Mingying ; Grzybowski, Stanislaw

  • Author_Institution
    State Key Lab. of Power Transm. Equip., Chongqing Univ., Chongqing, China
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    634
  • Lastpage
    637
  • Abstract
    This paper presented a novel approach to recognize ultra-high-frequency (UHF) signals of partial discharges (PDs). Four artificial insulation defect models were designed to generate PD UHF signals, which were detected by a Peano fractal antenna in experiments. Wavelet packet (WP) decomposition was used to decompose PD UHF signals into multiple scales. A group of energy parameters and fractal dimensions of PD UHF signals were computed and used as the input parameters of a support vector machine (SVM), which was used as the PD pattern classifier. For verifying the results of this approach, a back-propagation neural network (BPNN) was also used for pattern recognition of PD UHF signals. The recognition results showed that the SVM and the proposed parameters were qualified for PD pattern recognition and the SVM had advantages over the BPNN for the purpose.
  • Keywords
    UHF antennas; UHF detectors; backpropagation; fractal antennas; neural nets; partial discharges; pattern classification; signal detection; support vector machines; PD UHF signals; PD pattern recognition; artificial insulation defect models; backpropagation neural network; fractal dimensions; partial discharge; pattern classifier; peano fractal antenna; support vector machine; ultra high frequency signal recognition; wavelet packet decomposition; Atmospheric modeling; Fractal antennas; Fractals; Insulation; Partial discharges; Pattern recognition; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application (ICHVE), 2010 International Conference on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    978-1-4244-8283-2
  • Type

    conf

  • DOI
    10.1109/ICHVE.2010.5640783
  • Filename
    5640783