Title :
A fluxless Sn-In bonding process achieving high remelting temperature
Author :
Chuang, Ricky W. ; Choe, Selah ; Lee, Chin C.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
Abstract :
In this paper, we report a new alternative to the conventional solder. It is based on In-Sn multilayer composite design. This is a fluxless, oxidation-free, and most important of all, a non-eutectic soldering technique that can achieve a remelting temperature significantly higher than the bonding temperature. The In-Sn non-eutectic multilayer alloy so designed has the composition of 13.9 atomic% In and 86.1 atomic% Sn. The SEM and EDX analyses performed on the joint cross section clearly indicate a uniform joint thickness of 9 μm, while the joint microstructure is clearly visible and nearly void-free. The EDX results obtained also successfully demonstrate that the entire joint is heavily Sn-rich, as anticipated. The remelting temperature of several joints was analysed. It ranges from 175 to 190°C, The results clearly show that the joint composition is heavily Sn-rich, a very significant advantage from which it maximizes the temperature tolerance the device package can possibly handle
Keywords :
X-ray chemical analysis; indium alloys; melting; packaging; reflow soldering; scanning electron microscopy; tin alloys; 175 to 190 degC; 9 micron; EDX analyses; In-Sn; SEM analyses; device package; joint composition; joint cross section; multilayer composite design; noneutectic soldering technique; remelting temperature; temperature tolerance; uniform joint thickness; Bonding; Indium; Nonhomogeneous media; Oxidation; Packaging; Plastics; Soldering; Solids; Temperature; Tin;
Conference_Titel :
Electronic Components and Technology Conference, 2001. Proceedings., 51st
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-7038-4
DOI :
10.1109/ECTC.2001.927804