Title :
Comparison Of Results From Simple Expressions For MOSFET Parameter Extraction
Author :
Buemer, M.G. ; Lin, Y-S
Author_Institution :
California Institute Of Technology
Keywords :
Circuit testing; Current measurement; Data mining; Electrical resistance measurement; Foundries; Integrated circuit measurements; MOSFET circuits; Nonlinear equations; Parameter extraction; Voltage;
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/ICMTS.1988.672941
