• DocumentCode
    3163429
  • Title

    Comparison Of Results From Simple Expressions For MOSFET Parameter Extraction

  • Author

    Buemer, M.G. ; Lin, Y-S

  • Author_Institution
    California Institute Of Technology
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    90
  • Lastpage
    96
  • Keywords
    Circuit testing; Current measurement; Data mining; Electrical resistance measurement; Foundries; Integrated circuit measurements; MOSFET circuits; Nonlinear equations; Parameter extraction; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672941
  • Filename
    672941
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3163429