Title :
Defect Diagnostic Matrix -a Defect Learning Vehicle For Submicron Technologies
Author :
Newhart, Ronald E. ; Sprogis, Edmund J.
Author_Institution :
Ibm General Technology Division
Keywords :
Circuit testing; Conductors; Decoding; Distributed decision making; Isolation technology; Logic; Monitoring; Pattern recognition; Vehicles; Very large scale integration;
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/ICMTS.1988.672943
