Title :
Scalar Reflectometer Based Nondestructive Technique for Measuring Complex Permittivity and Permeability
Author :
Chen, Chun-Ping ; Ma, Zhewang ; Anada, Tetsuo ; Christopoulos, C.
Author_Institution :
Dept. of Electron. & Informatics, Kanagawa Univ., Yokohama
Abstract :
A low cost, scalar reflectometer based method, named "multithickness method" (MTM), is proposed for non-destructively and simultaneously charactering the complex permittivity and permeability of lossy materials via an open-ended coaxial probe (OECP). The spectral domain immitance (SDI) method has been used to theoretically model the OECP-based test setup, followed by the establishment of uncertainty analysis model. A discussion about how to select the multi thicknesses of test sample is also included based on the analysis and our experience. The broadband frequency-swept measurement, supported by the uncertainty analysis, has been conducted on a typical absorbing material under different thicknesses combination conditions. The experiment results agree well with the reference data, which validates the feasibility and effectiveness of this improved technique
Keywords :
coaxial cables; magnetic permeability measurement; microwave reflectometry; nondestructive testing; permittivity measurement; transmission lines; OECP-based test setup; absorbing material; broadband frequency-swept measurement; coaxial transmission lines; complex permittivity measurement; lossy materials; multithickness method; nondestructive technique; open-ended coaxial probe; permeability measurement; scalar reflectometer; spectral domain immitance; uncertainty analysis model; Coaxial components; Costs; Frequency; Loss measurement; Microwave measurements; Permeability measurement; Permittivity measurement; Probes; Reflection; Testing; Coaxial transmission lines; Measurement; Permeability; Permittivity; Sensors;
Conference_Titel :
Microwave Conference, 2006. 36th European
Conference_Location :
Manchester
Print_ISBN :
2-9600551-6-0
DOI :
10.1109/EUMC.2006.281069