Title :
Efficient error bit identification from failing signatures
Author :
Stroud, Charles E. ; Damarla, T. Raju
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Abstract :
Efficient identification of bit errors in the input to single and multiple input signature registers is obtained using a characteristic polynomial constructed from the product of multiple polynomials. This set of multiple polynomials may be primitive and/or non-primitive but must have different orders. The degree of the input polynomial to the signature register is limited to the least common multiple of the orders of these polynomials. The identification algorithm is based on look-up tables with the total number of entries equal the sum of the orders of these polynomials, making the technique more efficient than previous approaches in terms of both hardware and algorithmic complexity
Keywords :
built-in self test; digital integrated circuits; identification; integrated circuit testing; integrated logic circuits; logic testing; polynomials; table lookup; BIST; characteristic polynomial; error bit identification; failing signatures; identification algorithm; lookup tables; multiple input signature registers; single input signature registers; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault diagnosis; Hardware; Polynomials; Registers; Table lookup;
Conference_Titel :
ASIC Conference and Exhibit, 1996. Proceedings., Ninth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-3302-0
DOI :
10.1109/ASIC.1996.552006