DocumentCode :
3163672
Title :
Retargetable Self-Test Program Generation Using Constraint Logic Programming
Author :
Ulrich Bieker, Peter Marwedel
Author_Institution :
University of Dortmund, Department of Computer Science, Dortmund, Germany
fYear :
1995
fDate :
1995
Firstpage :
605
Lastpage :
611
Abstract :
This paper presents new techniques in two different areas. Firstly, it proposes a solution to the problem of testing embedded processors. Towards this end, it discusses the automatic generation of executable test programs from a specification of test patterns for processor components. Secondly, the paper shows how constraint logic programming (CLP) improves the software production process for design automation tools. The advantages of CLP languages include: built-in symbolic variables and the built-in support for constraints over finite domains such as integers and Booleans.
Keywords :
Automatic test pattern generation; Automatic testing; Built-in self-test; Computer science; Logic programming; Microprocessors; Production; Software tools; System testing; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1995. DAC '95. 32nd Conference on
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
0-89791-725-1
Type :
conf
DOI :
10.1109/DAC.1995.250018
Filename :
1586774
Link To Document :
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