Title :
An Efficient Algorithm for Local Don´t Care Sets Calculation
Abstract :
Local don´t cares of an internal node expressed in terms of its immediate inputs are usually of interest. One can directly apply any two-level minimizer on the on-set and the local don´t cares set to simplify an internal node. In this paper, we propose a memory efficient technique to calculate local don´t cares of internal nodes in a combinational circuit. Our technique of calculating local don´t cares makes use of automatic test pattern generation (ATPG) approach which allows us to identify quickly whether a cube in the local space is a don´t care or not. Unlike other approaches which construct an intermediate form of don´t cares in terms of the primary inputs, our technique directly computes the don´t care cubes in the local space. This gives us a significant advantage over the previous approaches in memory usage. Experimental results on MCNC benchmarks are very encouraging.
Keywords :
Automatic test pattern generation; Circuit faults; Design automation; Design engineering; Distributed computing; Fault diagnosis; Permission; Redundancy; Testing; Wire;
Conference_Titel :
Design Automation, 1995. DAC '95. 32nd Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-89791-725-1
DOI :
10.1109/DAC.1995.250047