DocumentCode :
3163836
Title :
An Efficient Algorithm for Local Don´t Care Sets Calculation
fYear :
1995
fDate :
1995
Firstpage :
663
Lastpage :
667
Abstract :
Local don´t cares of an internal node expressed in terms of its immediate inputs are usually of interest. One can directly apply any two-level minimizer on the on-set and the local don´t cares set to simplify an internal node. In this paper, we propose a memory efficient technique to calculate local don´t cares of internal nodes in a combinational circuit. Our technique of calculating local don´t cares makes use of automatic test pattern generation (ATPG) approach which allows us to identify quickly whether a cube in the local space is a don´t care or not. Unlike other approaches which construct an intermediate form of don´t cares in terms of the primary inputs, our technique directly computes the don´t care cubes in the local space. This gives us a significant advantage over the previous approaches in memory usage. Experimental results on MCNC benchmarks are very encouraging.
Keywords :
Automatic test pattern generation; Circuit faults; Design automation; Design engineering; Distributed computing; Fault diagnosis; Permission; Redundancy; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1995. DAC '95. 32nd Conference on
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
0-89791-725-1
Type :
conf
DOI :
10.1109/DAC.1995.250047
Filename :
1586784
Link To Document :
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