Title :
Freestanding tungsten wires for BM-HET
Author :
Takeuchi, K. ; Yamamoto, Ryo ; Maeda, H. ; Miyamoto, Y. ; Furuya, K.
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
Abstract :
When carriers are propagated only through intrinsic semiconductor, high-speed transistors can be realized due to reduction of scattering. We proposed hot electron transistor with a buried metallic gate (BM-HET) using double barrier as an emitter. In this device, gate metal buried in intrinsic semiconductor works as Schottky barrier to make attractive potential. Potential of the gate metal modulates the barrier height, resulting in modulation of the emitter current. In this report, we present freestanding wires fabricated by etching after buried growth to reduce a leakage current of BM-HET.
Keywords :
Schottky gate field effect transistors; buried layers; etching; hot electron transistors; leakage currents; tungsten; BM-HET; Schottky barrier; W; buried metallic gate; etching process; freestanding tungsten wire; high-speed electron device; hot electron transistor; intrinsic semiconductor; leakage current; Chemicals; Electron emission; Etching; Indium phosphide; Leakage current; Scattering; Transistors; Tungsten; Voltage; Wires;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2002. Digest of Papers. Microprocesses and Nanotechnology 2002. 2002 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-031-3
DOI :
10.1109/IMNC.2002.1178534