Title :
Spatially Non-uniform, Time Varying Thermal Characterization Of VlSI Chips
Author :
Cooke, B.J. ; Prince, J.L. ; Staszak, Z.J. ; Shope, D. ; Fahey, W.J.
Author_Institution :
University Of Arizona
Keywords :
Control systems; Drives; Electronic packaging thermal management; Semiconductor device measurement; Sensor arrays; System testing; Temperature control; Temperature sensors; Thermal sensors; Very large scale integration;
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/ICMTS.1988.672950
