Title :
Measurement of output driver impedance for signal integrity design consideration
Author :
Richard, W.-Y.C. ; Kye-Yak See ; Wei-Shan Soh ; Oswal, Manish ; Lin-Biao Wang
Author_Institution :
Guided Syst. Div., DSO Nat. Labs., Singapore, Singapore
Abstract :
Impedance matching is crucial in high-speed digital design to ensure signal integrity (SI). Accurate information of a device´s output impedance allows precise selection of series resistor to match the device´s output to the characteristic impedance of the connecting trace. This paper proposes an in-circuit measurement technique using two current probes to extract the output impedance information of an active device under its normal operating conditions. The measured impedance has been validated with the time-domain simulation results obtained from CST Design Studio.
Keywords :
driver circuits; electric impedance measurement; impedance matching; integrated circuit design; integrated circuit measurement; time-domain analysis; high-speed digital design; impedance matching; output driver impedance measurement; signal integrity design consideration; time-domain simulation; Coupling circuits; Data mining; Frequency measurement; Impedance matching; Impedance measurement; Integrated circuit interconnections; Measurement techniques; Probes; Resistors; Signal design; device characterization; in-circuit measurement; series termination;
Conference_Titel :
Microwave Conference, 2009. APMC 2009. Asia Pacific
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2801-4
Electronic_ISBN :
978-1-4244-2802-1
DOI :
10.1109/APMC.2009.5384220