Title :
Test Vehicle For The Measurement Of Charge Collection And Soft Error rate Prediction In high-density Memories due to /spl alpha/-particle strikes
Author :
Oldiges, Phil ; Furuyama, Tohru ; Frey, Jeffrey
Author_Institution :
Cornell University
Keywords :
Capacitors; Charge measurement; Current measurement; Density measurement; Error analysis; Monitoring; Random access memory; Testing; Vehicles; Voltage;
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/ICMTS.1988.672951
