• DocumentCode
    3164391
  • Title

    Evaluating Integrated Circuit Technologles For Space Application - The GVSC Test Chip

  • Author

    Wilson, K.T. ; Zietlow, T.C. ; Morse, T.C. ; Tsubota, T.K. ; Rollins, J.G. ; Herndon, R.R.

  • Author_Institution
    The Aerospace Corporation
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    154
  • Lastpage
    159
  • Keywords
    Aerospace testing; Application specific integrated circuits; Circuit testing; Electrical resistance measurement; Fabrication; Integrated circuit technology; Integrated circuit testing; Manufacturing; Risk management; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672952
  • Filename
    672952
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3164391