Title :
Evaluating Integrated Circuit Technologles For Space Application - The GVSC Test Chip
Author :
Wilson, K.T. ; Zietlow, T.C. ; Morse, T.C. ; Tsubota, T.K. ; Rollins, J.G. ; Herndon, R.R.
Author_Institution :
The Aerospace Corporation
Keywords :
Aerospace testing; Application specific integrated circuits; Circuit testing; Electrical resistance measurement; Fabrication; Integrated circuit technology; Integrated circuit testing; Manufacturing; Risk management; Space technology;
Conference_Titel :
Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
Conference_Location :
Long Beach, CA, USA
DOI :
10.1109/ICMTS.1988.672952
