DocumentCode
316443
Title
Voltage Breakdown In Vacuum Microelectronics Microwave Devices Using Field Emiitter Arrays Causes, Possible Solutions And Recent Progress
Author
Charbonnier, Francis
Author_Institution
Linfield Research Institute
fYear
1997
fDate
17-21 Aug. 1997
Firstpage
7
Lastpage
13
Keywords
Current density; Dielectric breakdown; Iron; Microelectronics; Microwave antenna arrays; Microwave devices; Pulse amplifiers; Testing; Vacuum breakdown; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1997. Technical Digest., 1997 10th International
Conference_Location
Kyongju, Korea
Print_ISBN
0-7803-3786-7
Type
conf
DOI
10.1109/IVMC.1997.627378
Filename
627378
Link To Document