DocumentCode :
316443
Title :
Voltage Breakdown In Vacuum Microelectronics Microwave Devices Using Field Emiitter Arrays Causes, Possible Solutions And Recent Progress
Author :
Charbonnier, Francis
Author_Institution :
Linfield Research Institute
fYear :
1997
fDate :
17-21 Aug. 1997
Firstpage :
7
Lastpage :
13
Keywords :
Current density; Dielectric breakdown; Iron; Microelectronics; Microwave antenna arrays; Microwave devices; Pulse amplifiers; Testing; Vacuum breakdown; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1997. Technical Digest., 1997 10th International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-3786-7
Type :
conf
DOI :
10.1109/IVMC.1997.627378
Filename :
627378
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=316443
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