Title :
Field Emission Devices with Built-in p-n Junction
Author :
Laou, P. ; Qiu, C.X. ; Shih, I.
Author_Institution :
Department of Electrical Engineering, McGill University
Keywords :
Electron guns; Etching; Fabrication; Impurities; P-n junctions; Phosphors; Silicon; Stability; Testing; Voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 1997. Technical Digest., 1997 10th International
Conference_Location :
Kyongju, Korea
Print_ISBN :
0-7803-3786-7
DOI :
10.1109/IVMC.1997.627391
