DocumentCode
3164619
Title
Zero capacitor embedded memory technology for system on chip
Author
Okhonin, S. ; Fazan, P. ; Jones, M.-E.
Author_Institution
Innovative Silicon Inc., Santa Clara, CA
fYear
2005
fDate
5-5 Aug. 2005
Abstract
By harnessing the floating body (FB) effect of silicon on insulator devices, the authors introduced a true capacitor-less, single transistor DRAM - named Z-RAMtrade (zero capacitance DRAM) - which is capable of doubling memory density when compared to existing embedded DRAM technology (and achieving five times the density of current embedded SRAM), yet requires no exotic materials, no extra mask steps and no new physics. As no capacitor is required, the Z-RAM cell can readily be scaled as far as the transistor. The technology´s bit-cell scalability was demonstrated at the 45nm node. It is easily envisaged that Z-RAM technology will scale well to at least the 22nm process node and ISi has already measured suitable characteristics in the FinFET transistors that may well be used at that time
Keywords
DRAM chips; MOSFET; embedded systems; integrated circuit design; silicon-on-insulator; system-on-chip; 45 nm; FinFET; floating body effect; memory density; silicon on insulator; single transistor DRAM; system on chip; zero capacitor embedded memory; Capacitance; Capacitors; FinFETs; Intersymbol interference; Physics; Random access memory; Scalability; Silicon on insulator technology; System-on-a-chip; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design, and Testing, 2005. MTDT 2005. 2005 IEEE International Workshop on
Conference_Location
Taipei
ISSN
1087-4852
Print_ISBN
0-7695-2313-7
Type
conf
DOI
10.1109/MTDT.2005.4655409
Filename
4655409
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