• DocumentCode
    3164619
  • Title

    Zero capacitor embedded memory technology for system on chip

  • Author

    Okhonin, S. ; Fazan, P. ; Jones, M.-E.

  • Author_Institution
    Innovative Silicon Inc., Santa Clara, CA
  • fYear
    2005
  • fDate
    5-5 Aug. 2005
  • Abstract
    By harnessing the floating body (FB) effect of silicon on insulator devices, the authors introduced a true capacitor-less, single transistor DRAM - named Z-RAMtrade (zero capacitance DRAM) - which is capable of doubling memory density when compared to existing embedded DRAM technology (and achieving five times the density of current embedded SRAM), yet requires no exotic materials, no extra mask steps and no new physics. As no capacitor is required, the Z-RAM cell can readily be scaled as far as the transistor. The technology´s bit-cell scalability was demonstrated at the 45nm node. It is easily envisaged that Z-RAM technology will scale well to at least the 22nm process node and ISi has already measured suitable characteristics in the FinFET transistors that may well be used at that time
  • Keywords
    DRAM chips; MOSFET; embedded systems; integrated circuit design; silicon-on-insulator; system-on-chip; 45 nm; FinFET; floating body effect; memory density; silicon on insulator; single transistor DRAM; system on chip; zero capacitor embedded memory; Capacitance; Capacitors; FinFETs; Intersymbol interference; Physics; Random access memory; Scalability; Silicon on insulator technology; System-on-a-chip; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design, and Testing, 2005. MTDT 2005. 2005 IEEE International Workshop on
  • Conference_Location
    Taipei
  • ISSN
    1087-4852
  • Print_ISBN
    0-7695-2313-7
  • Type

    conf

  • DOI
    10.1109/MTDT.2005.4655409
  • Filename
    4655409