DocumentCode :
3164767
Title :
A 16 Mb mask ROM with programmable redundancy
Author :
Naruke, Y. ; Iwase, T. ; Takizawa, M. ; Saito, K. ; Asano, M. ; Nishimura, H. ; Mochizuki, T.
Author_Institution :
Toshiba Corp., Kawasaki, Japan
fYear :
1989
fDate :
15-17 Feb. 1989
Firstpage :
128
Lastpage :
129
Abstract :
In response to demands for a mask ROM with large bit capacity, a 1M-word*16 bit mask ROM with 120-ns access time has been fabricated. A programmable redundancy technique utilizes electrically fusible polysilicon links with the secondary breakdown mechanism of a MOSFET for high production yield and small chip area. The memory cell matrix arranged in 8192 rows*2048 columns and is divided into four blocks by two sets of row decoders in order to reduce word line delay. The redundancy cell array is composed of 8 rows*256 columns which can replace four defective quarter-rows. The mask ROM is fabricated in single-polysilicon single-aluminium twin-well CMOS technology with 0.7- mu m photolithography for high bit density. The process parameters and design features of the mask ROM are given together with a block diagram.<>
Keywords :
CMOS integrated circuits; cellular arrays; integrated memory circuits; read-only storage; redundancy; 0.7 micron; 120 ns; 16 Mbit; Al metallisation; access time; electrically fusible polysilicon links; mask ROM; memory cell matrix; programmable redundancy; redundancy cell array; row decoders; twin-well CMOS technology; Cities and towns; Decoding; Differential amplifiers; Electric breakdown; Error correction codes; Feedback circuits; Fuses; Read only memory; Redundancy; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1989. Digest of Technical Papers. 36th ISSCC., 1989 IEEE International
Conference_Location :
New York, NY, USA
Type :
conf
DOI :
10.1109/ISSCC.1989.48206
Filename :
48206
Link To Document :
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