• DocumentCode
    3164882
  • Title

    CMOS Process Monitor

  • Author

    Buehler, M.G. ; Linholm, L.W. ; Tyree, V.C. ; Men, R.A. ; Blaes, B.R. ; Jennings, G.A. ; Hicks, K.A.

  • Author_Institution
    California Institute of Technology
  • fYear
    1988
  • fDate
    22-23 Feb. 1988
  • Firstpage
    164
  • Lastpage
    168
  • Keywords
    Algorithm design and analysis; CMOS process; CMOS technology; Circuit testing; Condition monitoring; Integrated circuit testing; Laboratories; Microelectronics; Propulsion; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on
  • Conference_Location
    Long Beach, CA, USA
  • Type

    conf

  • DOI
    10.1109/ICMTS.1988.672954
  • Filename
    672954
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3164882