DocumentCode
316500
Title
A Model for Field -Emission from P-Type Silicon
Author
Qin-An Huan ; Ming Qin ; Bin Zhang
Author_Institution
Microelectronics Center, Southeast University
fYear
1997
fDate
17-21 Aug. 1997
Firstpage
291
Lastpage
295
Keywords
Cathodes; Electric breakdown; Electron emission; Impact ionization; Microelectronics; Resistance heating; Silicon compounds; Space charge; Tunneling; Vacuum technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1997. Technical Digest., 1997 10th International
Conference_Location
Kyongju, Korea
Print_ISBN
0-7803-3786-7
Type
conf
DOI
10.1109/IVMC.1997.627563
Filename
627563
Link To Document