Title :
A self calibration technique for monolithic high-resolution D/A converters
Author :
Groeneveld, W. ; Schouwenaars, H. ; Termeer, H.
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
A D/A (digital/analog) and A/D (analog/digital) self-calibrated technique is presented which does not need a calibration period, additional trimming, or external component and is insensitive to process variations. The technique is based on calibration of a current source. The basic block diagram of a 16-bit D/A converter is shown. The common calibration circuitry is also presented. The measured signal-to-noise ratio, including harmonic distortion, versus the output voltage of the 16-bit DAC is shown.<>
Keywords :
calibration; digital-analogue conversion; monolithic integrated circuits; 16 bit; ADC; current source calibration; harmonic distortion; monolithic high-resolution D/A converters; output voltage; self calibration technique; signal-to-noise ratio; Calibration; Capacitance; Circuits; Clocks; Diodes; Frequency; Low voltage; MOSFETs; Routing; Sampling methods;
Conference_Titel :
Solid-State Circuits Conference, 1989. Digest of Technical Papers. 36th ISSCC., 1989 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1989.48217
